If you are in search of part numbers like 902-470, ANUSM206A, and others that fall under the NSN 6625-00-179-5844, we have you covered with the catalog and procurement resources provided on this page. At the top of the page, you will be able to review a number of details and data that pertain to this particular NSN, while available offerings are listed out below. If any items on our NSN 6625-00-179-5844 catalog interest you, be sure to request a quote from our staff at your earliest convenience. You can do this by submitting a Request for Quote (RFQ) form through our website or by getting in touch with our team via phone or email.
As an ASAP Semiconductor platform operating with quality as a focus, all NSN 6625-00-179-5844 parts we stock come from trusted manufacturers and undergo any necessary inspections or testing prior to shipment. Additionally, every purchase you make will come delivered with all applicable qualifying certifications or manufacturing trace documentation. Aside from such commitments, we also strive to provide customers procurement solutions that equally balance competitive pricing and timely fulfillment. With so much to offer, choose ASAP MilSTD for NSN 6625-00-179-5844 supplies and more.
Item Name | Test Set Semiconduc |
Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
National Item Identification Number (NIIN) | 00-179-5844 (001795844) |
NCB Code | USA (00) |
Manufacturer | Hickok Incorporated, Joint Electronics Type Designation System |
Part Number | Manufacturer | Item Name | Cage Code | RFQ |
---|---|---|---|---|
902-470 | hickok incorporated | test set semiconduc | 28569 | RFQ |
902-470 | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
ANUSM206A | hickok incorporated | test set semiconduc | 28569 | RFQ |
ANUSM206A | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
FAAZ | PHASE | SINGLE |
AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
ABRY | LENGTH | 9.000 INCHES NOMINAL |
ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
HGTH | HEIGHT | 10.000 INCHES NOMINAL |
AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
ABGL | WIDTH | 8.000 INCHES NOMINAL |
Relevant Components for NSN - 6625-00-179-5844, 6625001795844 | ||||
6625-01-160-1063 (6625011601063) | 6625-01-429-8096 (6625014298096) | 6625-00-651-5332 (6625006515332) | 6635-01-391-3365 (6635013913365) | |
6680-01-221-3719 (6680012213719) | 6680-01-481-5645 (6680014815645) | 6625-01-590-9595 (6625015909595) | 6625-01-058-0139 (6625010580139) | |
6640-00-973-9439 (6640009739439) | 6625-00-578-5652 (6625005785652) | 6625-01-335-3088 (6625013353088) | 6625-01-518-7606 (6625015187606) | |
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