If you are in search of part numbers like 5999965, TS-3253-TPM-39, and others that fall under the NSN 6625-00-222-1117, we have you covered with the catalog and procurement resources provided on this page. At the top of the page, you will be able to review a number of details and data that pertain to this particular NSN, while available offerings are listed out below. If any items on our NSN 6625-00-222-1117 catalog interest you, be sure to request a quote from our staff at your earliest convenience. You can do this by submitting a Request for Quote (RFQ) form through our website or by getting in touch with our team via phone or email.
As an ASAP Semiconductor platform operating with quality as a focus, all NSN 6625-00-222-1117 parts we stock come from trusted manufacturers and undergo any necessary inspections or testing prior to shipment. Additionally, every purchase you make will come delivered with all applicable qualifying certifications or manufacturing trace documentation. Aside from such commitments, we also strive to provide customers procurement solutions that equally balance competitive pricing and timely fulfillment. With so much to offer, choose ASAP MilSTD for NSN 6625-00-222-1117 supplies and more.
| Item Name | Test Set Semiconductor Device |
| Federal Supply Group (FSG) | Instruments and Laboratory Equipment |
| Federal Supply Class (FSC) | 6625 Electrical and Electronic Properties Measuring and Testing Instruments |
| National Item Identification Number (NIIN) | 00-222-1117 (002221117) |
| NCB Code | USA (00) |
| Manufacturer | Itt Corporation, Harris Corporation, Joint Electronics Type Designation System |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| 5999965 | itt corporation | test set semiconductor device | 0m5j5 | RFQ |
| 5999965 | harris corporation | test set semiconduc | 24930 | RFQ |
| 5999965 | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
| TS-3253-TPM-39 | joint electronics type designation system | test set semiconduc | 80058 | RFQ |
| TS-3253-TPM-39 | harris corporation | test set semiconduc | 24930 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ZZZV | Fsc Application Data | TEST SET,ELECT. EQUIP. |
| ANNQ | Material And Location | ALUMINUM HOUSING |
| MRC | Decoded Requirement | Clear Text Reply |
| HGTH | Height | 3.880 INCHES NOMINAL |
| AKWA | Joint Electronics Type Designation System Item Name | TEST SET,SEMICONDUCTOR DEVICE |
| AKWB | Joint Electronics Type Designation System Item Type Number | TS-3253/TPM-39 |
| ANPZ | Inclosure Feature | SINGLE ITEM W/HOUSING |
| ABGL | Width | 4.250 INCHES NOMINAL |
| AQXY | Test Type For Which Designed | MICROWAVE DIODE CURRENT |
| SFTT | Surface Treatment | ENAMEL |
| AQXZ | Operating Test Capability | MICROAMPHERE METER RANGE 0-1000 UA DC |
| ABRY | Length | 5.500 INCHES NOMINAL |
| Relevant Components for NSN - 6625-00-222-1117, 6625002221117 | ||||
| 6660-00-527-7116 (6660005277116) | 6650-00-160-0570 (6650001600570) | 6695-01-458-9187 (6695014589187) | 6680-01-072-9450 (6680010729450) | |
| 6665-01-444-8323 (6665014448323) | 6685-01-562-3467 (6685015623467) | 6670-01-108-7891 (6670011087891) | 6625-00-912-0434 (6625009120434) | |
| 6650-01-276-2869 (6650012762869) | 6695-00-026-7643 (6695000267643) | 6625-00-635-4200 (6625006354200) | 6625-01-535-4893 (6625015354893) | |
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