Thank you for taking an interest in the various military and defense parts, aerospace parts, and other items that we offer. You have reached the RFQ page for part number SL2809, a Fairchild Semiconductor Corp item with the NSN 5962008278039 that is listed alongside the description “Microcircuit Digital.” If you are interested in part number SL2809 and wish to learn more about your purchasing options, be sure to submit the form below at your earliest convenience while supplying us with important information concerning your needs and restrictions alike. Once we have a chance to receive and review your completed form, a member of our staff will reach out to you in 15 minutes or less to present a tailored solution for your comparisons.
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To ensure that shopping with us is as simple as possible, we make it easy to identify and procure exact items by listing parts alongside all applicable designations and information. For example, part number SL2809 is specifically listed with the NSN 5962-00-827-8039, and this code can be used to determine that it falls under FSC 5962 Microcircuits Electronic. Additionally, while tracing back to Fairchild Semiconductor Corp, this NSN part was specifically produced under CAGE Code 07263. With our services and dedication to simple procurement in mind, get started with us today!
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-00-827-8039 Item Description: MICROCIRCUIT,DIGITAL | 5962 | 008278039 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
U | B | U | ||||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
SL2809 | 3 | 9 | 5 |
MRC | Criteria | Characteristic |
---|---|---|
CZEQ | Time Rating Per Chacteristic | 80.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
AFJQ | Storage Temp Range | -65.0/+150.0 DEG CELSIUS |
ADAT | Body Width | 0.220 INCHES MINIMUM AND 0.280 INCHES MAXIMUM |
CQZP | Input Circuit Pattern | DUAL 5 INPUT |
CQSJ | Inclosure Material | CERAMIC AND GLASS |
CSSL | Design Function And Quantity | 2 GATE, NAND |
CBBL | Features Provided | MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS AND EXPANDABLE AND MEDIUM SPEED |
ADAQ | Body Length | 0.660 INCHES MINIMUM AND 0.785 INCHES MAXIMUM |
AEHX | Maximum Power Dissipation Rating | 26.0 MILLIWATTS |
ADAU | Body Height | 0.140 INCHES MINIMUM AND 0.180 INCHES MAXIMUM |
CTFT | Case Outline Source And Designator | T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL |
CQSZ | Inclosure Configuration | DUAL-IN-LINE |
AFGA | Operating Temp Range | -55.0/+125.0 DEG CELSIUS |
TEST | Test Data Document | 80070-17-12054 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
MRC | Decoded Requirement | Clear Text Reply |
CQWX | Output Logic Form | DIODE-TRANSISTOR LOGIC |
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