Request a Quote for 5999965 Itt Corporation Part With the NSN 6625-00-222-1117 Today

Part Number: 5999965

Manufacturer: Itt Corporation

NSN: 6625-00-222-1117

NIIN: 002221117

Item Name : Test Set Semiconductor Device

CAGE Code: 0M5J5

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country: USA

NCB Code: 00

Thank you for taking an interest in the various military and defense parts, aerospace parts, and other items that we offer. You have reached the RFQ page for part number 5999965, a Itt Corporation item with the NSN 6625002221117 that is listed alongside the description “Test Set Semiconductor Device.” If you are interested in part number 5999965 and wish to learn more about your purchasing options, be sure to submit the form below at your earliest convenience while supplying us with important information concerning your needs and restrictions alike. Once we have a chance to receive and review your completed form, a member of our staff will reach out to you in 15 minutes or less to present a tailored solution for your comparisons.

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To ensure that shopping with us is as simple as possible, we make it easy to identify and procure exact items by listing parts alongside all applicable designations and information. For example, part number 5999965 is specifically listed with the NSN 6625-00-222-1117, and this code can be used to determine that it falls under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments. Additionally, while tracing back to Itt Corporation, this NSN part was specifically produced under CAGE Code 0M5J5. With our services and dedication to simple procurement in mind, get started with us today!

Characteristics Data of NSN 6625-00-222-1117, 6625002221117

MRC	Criteria	Characteristic
ZZZV	Fsc Application Data	TEST SET,ELECT. EQUIP.
ANNQ	Material And Location	ALUMINUM HOUSING
MRC	Decoded Requirement	Clear Text Reply
HGTH	Height	3.880 INCHES NOMINAL
AKWA	Joint Electronics Type Designation System Item Name	TEST SET,SEMICONDUCTOR DEVICE
AKWB	Joint Electronics Type Designation System Item Type Number	TS-3253/TPM-39
ANPZ	Inclosure Feature	SINGLE ITEM W/HOUSING
ABGL	Width	4.250 INCHES NOMINAL
AQXY	Test Type For Which Designed	MICROWAVE DIODE CURRENT
SFTT	Surface Treatment	ENAMEL
AQXZ	Operating Test Capability	MICROAMPHERE METER RANGE 0-1000 UA DC
ABRY	Length	5.500 INCHES NOMINAL