Thank you for taking an interest in the various military and defense parts, aerospace parts, and other items that we offer. You have reached the RFQ page for part number TS268EU, a Voron Electronics Corp item with the NSN 6625009236534 that is listed alongside the description “Test Set Semiconduc.” If you are interested in part number TS268EU and wish to learn more about your purchasing options, be sure to submit the form below at your earliest convenience while supplying us with important information concerning your needs and restrictions alike. Once we have a chance to receive and review your completed form, a member of our staff will reach out to you in 15 minutes or less to present a tailored solution for your comparisons.
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To ensure that shopping with us is as simple as possible, we make it easy to identify and procure exact items by listing parts alongside all applicable designations and information. For example, part number TS268EU is specifically listed with the NSN 6625-00-923-6534, and this code can be used to determine that it falls under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments. Additionally, while tracing back to Voron Electronics Corp, this NSN part was specifically produced under CAGE Code 94518. With our services and dedication to simple procurement in mind, get started with us today!
MRC | Criteria | Characteristic |
---|---|---|
ABRY | Length | 8.187 INCHES NOMINAL |
MRC | Decoded Requirement | Clear Text Reply |
HGTH | Height | 3.625 INCHES NOMINAL |
AQXZ | Operating Test Capability | FRONT RESISTANCE-NOT GREATER THAN 0.5 KILOHM FOR A GOOD CRYSTAL; BACK RESISTANCE-RATIO OF BACK TO FRONT RESISTANCE GREATER THAN 10 TO 1 FOR A GOOD CRYSTAL; BACK CURRENT-CRYSTAL SHOULD NOT INDICATE CURRENT GREATER THAN - CRYSTAL IN21 AND IN23,IN23A,IN25,IN21A AND IN23B,IN21B,IN26 WE,IN26 SYL,IN78 SYL - CURRENT D. C. 0.400 MA,0.300 MA,0.250 MA,0.175 MA,0.125 MA,0.110 MA,0.230 MA,0.160 MA |
ABGL | Width | 6.000 INCHES NOMINAL |
AQXY | Test Type For Which Designed | FRONT RESISTANCE OF CRYSTAL; BACK RESISTANCE OF CRYSTAL; BACK CURRENT OF CRYSTAL |
ALSF | Internal Battery Accommodation | INCLUDED |
ANPZ | Inclosure Feature | SINGLE ITEM W/CARRYING CASE |
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